Synchrotron radiation based imaging XAFS analysis of simulated high-level waste glass

Okamoto, Yoshihiro; Nakada, Masami; Akabori, Mitsuo; Komamine, Satoshi*; Fukui, Toshiki*; Ochi, Eiji*; Nitani, Hiroaki*; Nomura, Masaharu*

no journal, , 

Distribution and the chemical state of fission product elements like Zr, Mo and Ru in the simulated high-level waste glass were examined by using the synchrotron radiation based X-ray imaging technique. We used the high resolution imaging system and the high-speed CCD camera for imaging XAFS measurement of the glass sample at molten state. Position sensitive X-ray absorption spectra were obtained by analyzing gray scale in images of the CCD camera.